Navigation:  References > Articles related to optical spectroscopy

[Brendel 1990A]

R.Brendel, Appl. Phys. A50, 587 (1990)

 

[Bergman 1978 A]

D.Bergman, Phys. Rep. C 43 (1978), 377

 

[Bruggeman 1935A]

D.A.G. Bruggeman, Ann. Phys. 24 (1935), 636

 

[Campi 1988A]

D.Campi, C. Coriasso: 'Prediction of optical properties of amorphous tetrahedrally bonded materials', J. Appl. Phys. 64 (8) (1988), 4128-4134

 

[Eickhoff 1992A]        

T.Eickhoff, P.Grosse, S.Henkel, W.Theiß: 'Determination of the effective dielectric function of silver powders produced by inert gas evaporation', Z.Phys.B. - Condensed Matter 88 (1992), 17-23

 

[Evenschor 1990A]        

M.Evenschor, P.Grosse, W.Theiß, 'Optics of two-phase composites', Vibrational Spectroscopy 1 (1990), 173-177

 

[Gervais 1974]  

F.Gervais, B.Piriou, J.Phys.C: Solid State Phys., Vol. 7 (1974), 2374

 

P.Grosse, 'Characterization of Thin Solid Films and Surfaces by Infrared Spectroscopy', in Festkörperprobleme 31, ed. by R. Helbig (Vieweg, Braunschweig, Wiesbaden 1991), 77-97

 

[Harbecke 1986A]        

B.Harbecke, 'Coherent and Incoherent Reflection and Transmission of Multilayer Structures', Appl. Phys. B 39 (1986), 165-170

 

[Jellison 1998A]

G.E.Jellison, Jr., 'Spectroscopic ellipsometry data analysis: measured versus calculated quantities', Thin Solid Films 313-314 (1998), 33-39

 

[Kim 1992]

C.C. Kim, J.W. Garland, H. Abad, P.M. Raccah, Phys. Rev. B 45 (20) 1992, 11749-11767

 

[Looyenga]

H.Looyenga, Physica 31 (1965), 401

 

[Maxwell Garnett 1904A]

J.C.Maxwell Garnett, Philos. Trans. R. Soc. London 203 (1904), 385

 

[O'Leary 1997A]

S.K.O'Leary, S.R.Johnson, P.K.Lim, J.Appl. Phys. Vol. 82, No. 7 (1997), 3334-3340

 

[Park 1997]

J.H.Park, Y.J.Park, Y.M.Hwang ,'Design and fabrication of dichroic mirrors for color separation and recombination of Kr-Ar laser (white laser)' ,  SPIE Vol. 3133 (1997), 288

 

[Parikh 1992A]        

A.N.Parikh, D.L.Allara: 'Quantitative determination of molecular structure in multilayered thin films of biaxial and lower symmetry from photon spectroscopies. I.Reflection infrared vibrational spectroscopy', J.Chem.Phys 96 (2) (1992), 927-945

 

[Press 1992]        

W.H.Press, S.A.Teukolsky, W.T.Vettering, B.P.Flannery, 'Numerical recipes in C', Cambridge University Press, New York, 1992; 408-412

 

[Sturm 1991A]        

J.Sturm, P.Grosse, W.Theiß: 'Effective dielectric functions of samples obtained by evaporation of alkali halides', Z.Phys.D. - Atoms, Molecules and Clusters 20 (1991), 341-343

 

[Sturm 1991B]        

J.Sturm, P.Grosse, W.Theiß: 'Effective dielectric functions of alkali halide composites and their spectral representation', Z.Phys.B. - Condensed Matter 83 (1991), 361-365

 

[Theiss 1994A]

W.Theiß, 'The Use of Effective Medium Theories in Optical Spectroscopy', in Festkörperprobleme 33, ed. by R. Helbig (Vieweg, Braunschweig, Wiesbaden 1994), 149-176

 

[Theiss 1994B]

W.Theiß, S.Henkel, M.Arntzen, "Connecting microscopic and macroscopic properties of porous media: choosing appropriate effective medium concepts", Thin Solid Films 255 (1995), 177-180

 

[Theiss 1995A]

W.Theiß, M.Wernke, V.Offermann, "Depth profiling of porous silicon layers by ATR spectroscopy", Thin Solid Films 255 (1995), 181-184

 

[Theiss 1995B]

W.Theiß, S.Henkel, M.Arntzen, "Connecting microscopic and macroscopic properties of porous media: choosing appropriate effective medium concepts", Thin Solid Films 255 (1995), 177-180

 

[Theiss 1997A]

W.Theiß, "Optical properties of porous silicon", Surface Science Reports 29, No. 3/4 (1997), 91-192

 

[Valk 1998A]

J.Valk, S.van Enckevort, W.Theiß, "Infrared analysis of thin films deposited on rough and curved substrates", AIP conference proceedings 430 (1998), 647